Analysis of Nano and Micro fiber made easy
19 April 2009A new automated system that uses electron imaging and analysis system for analyzing Nano and Micro fiber has been developed recently. The new system known as Fibermetric TMÂ is powered with Phenom electron microscope and is designed to quantify accurate properties of fiber samples quickly and easily. The technique will help many producers of woven or synthetic fibers for quality check of their products much faster.
The system is easy to handle and does not require any pre-training to the operating staff and it uses a personal electron microscope, which automatically collects hundreds of images and analyze the images quickly and gives the relevant information about pore size distribution of the fiber and predict the important parameter such as filtration efficiency.
The fibermetric device takes less than 30 seconds for loading a fiber sample and once it loads the samples to one of the best SEM (Scanning electron microscope), which ultimately magnifies the image upto 24000 times so that the instrument can provide accurate information about fiber size up to 100 nanometer.
Vice president and general manager of technical division of FEI, Mr. Paul Scagnetti assures that it will deliver the return on investment rapidly as Fibermetric is available at an affordable price, it is much accurate and its overall accuracy is above 97 percent, easy to use and it provides results quickly.
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