New metrology system for solar photo voltaic applications
23 July 2009Nanometrics, a major a manufacturer and supplier of modern state of the art metrology systems has newly launched the TSM integrated metrology system. It is the latest product offered by Nanometrics. The company is based at California, is the leader in marketing and marketing of integrated metrology systems that are used to measure thin film properties, optical and material properties and structural properties of silicon used in semiconductor as well as photo voltaic devices.
The latest technology in TSM is useful in measuring the film thickness on high throughput processes and Nanometrics claims that this will provide the advantage of controlling the controlling the complex thin films silicon cells.
The technology will further integrate the various processes of solar cell manufacturing lines so as to provide a good control in especially critical layers of the system. As these systems are able to provide the precise metrology and therefore can be used in most complex thin film solar materials including vacuum and atmospheric systems, high roughness copper indium gallium salenide and copper telluride.
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