New silicon drift detector (SDD) designed for nanotechnology characterization
1 March 2010SII NanoTechnology Inc;, is one of the leading company engaged in development and research activities in the areas of X-ray detection and spectrometric systems has recently designed a custom silicon drift detector (SDD). The new detector has larger solid angle improved roughly twenty times than the conventional one and therefore has much improvement and is best suited for nanotechnology characterization.
SII Nano Technology group is continuously launches new products that are not only innovative bust cost effective also and thus helps the whole community looking for XRF and X-ray solutions.
Instruments including Argonne National Laboratory’s products are capable to deliver the best spatial resolution to characterize different nanotechnology based materials, however now by customizing the 50mm 2SDD with larger solid angle, the scanning electron microscope (SEM) has become much more advanced and the new large slid angle SDD spectrophotometer will provide excellent energy resolution..
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