New technique for monitoring nanomatrial developed

13 November 2008

Gow-Ching Wang, a professor and head physics, applied physics and astronomy, the lead researchers from Rensselaer Polytechnic Institute have developed a new measurement technique that is helpful in mapping nanomaterials as they grow. This new technique will help in growing better quality nanomaterials, which will lead to development of increased magnetic data storage devices and solar panels.

The conventional technique used for monitoring a nanomaterial uses a reflection high – energy electron diffraction (RHEED), which creates an interference pattern on nanomaterial surface. For the present study, researchers modified the RHEED, as the technique provides only partial information of the surface. In the modified technique, a complete picture of crystal orientation distribution of the growing surface is obtained by rotating the substrate on which the nanomaterial is being grown.

Nanostructures including nanorods, nanodots and nanoblades are useful for data storage devices and the growth and morphology of these nanomaterials needs to be strongly monitored during the growth. During growth, the change in structure and morphology can decrease the efficiency of the device for which the nanomaterial is used.

One of the most important application of the nanomaterial is the solar panel used for converting solar energy to electricity. The present solar panel contains a single crystal material having no grain boundaries and therefore the cost of these is very high. Researchers are working towards making a polycrystalline material that acts as a single crystal and the present technique will be helpful in achieving the desired result.

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